Anteral

In this section, will be added all occurrences and references to Anteral or its research and development areas, in different media. Also will be added some project or news about public events in which it participates Anteral.

Anteral obtains ISO 9001:2008 certificate

After an exhaustive audit and verification process by the prestigious certification entity TÜV Rheinland, Anteral has obtained the ISO 9001:2008 certificate.

The top priority at Anteral is maintaining customer satisfaction and a consistent level of trust in our products, and quality assurance is an integral part of all of our business processes. For that reason, since the company creation in 2011, the company executive board worked to develop and implement a comprehensive and exigent Quality Management System.

The ISO 9001 certification for both Antennas and THz business lines was initiated at Anteral’s own wish in order to show our singular focus on quality. This certification, with worldwide recognized prestige and value, assures that the Quality Management System implemented by Anteral is adjusted to the most exigent standards, and is capable of providing products and services of great value, perfectly adjusted to the requirements and needs of our customers.

Download Certificate:  Anteral ISO 9001:2008 certificate 

Anteral in the Mechatronics in Navarra portfolio

 

Anteral appears in the Mechatronics in Navarra Portfolio, published by the MODERNA foundation. This portfolio contains all the companies forming part of the mechatronic cluster of Navarra, which represent the region competitiveness and innovation leaders.

Download Portfolio:  Mechatronics in Navarra.pdf

Anteral invited to the III EIBT - SUDOE Business Meeting

Anteral has been invited and will attend the III EIBT – SUDOE Business Meeting that will be held next March 21th in Bordeaux (France) with the participation of key companies from the Aquitaine region, and Spanish and Portuguese commercial delegations. 

The list of participants includes technological startups from the five regions involved in the EIBT – SUDOE project (Asturias, Aquitaine, Navarra, Basque Country and Alentejo), as well as big tractor companies like the Aerospace Valley Cluster, Thales, and the Grand Port Maritime of Bordeaux.

The main objective of the meeting is encouraging the international collaboration between innovative companies, and establishing a transnational contact network.

More information: http://www.european-business-day.com/

Results of joint research between Anteral and Public University of Navarra, to be published at EuCAP 2013

As part of its strong R&D strategy, Anteral has several ongoing research projects, jointly with the Antenna Research Group of Public University of Navarra (UPNA).

One of these projects, focused in the development of new Terahertz cameras, will present some of its results under the title "Image Acquisition at W-band Using a Frequency Scanning Antenna Array", at the EuCAP 2013 conference that will be held from 8th to 12th of April at Gothenburg, Sweden. The oral presentation will be given by Belén Larumbe, member of the Antenna Research Group of UPNA, and main author of the work with the coauthors Asier Ibáñez, member of Anteral, and Ainara Rebollo, Ramón Gonzalo and Jorge Teniente, members also of the Antenna Research Group of UPNA.

 Developed antenna array

The new Terahertz cameras under development in this project have multiple applications in fields like automotive radars, air and sea navigation under low visibility conditions with fog or smoke, borderland enforcement and concealed weapon detection. In particular, the work that will be presented is focused in the design and study of a novel antenna array with frequency scanning, and its application in image acquisition systems, in order to replace mechanical aiming systems with electronic systems, reducing cost and complexity.

The EuCAP event is the main antenna and propagation conference at the European level, and it is organized yearly by the European Association on Antennas and Propagation (EurAAP).

 

 

Image Acquisition at W-band Using a Frequency Scanning Antenna Array
 
Belén Larumbe-Gonzalo1, Asier Ibáñez2, Ainara Rebollo-Mugueta1, Ramón Gonzalo1 and Jorge Teniente-Vallinas1
 
1Antenna Group. TSC Area. IEE Department. Public University of Navarra. Campus de Arrosadia 31006 Pamplona (Navarra) Spain
2Anteral S.L. Edificio I+D "Jerónimo de Ayanz", Campus Arrosadia. 31006 Pamplona (Navarra) Spain.
 
Abstract: This paper presents the development of an antenna scanning structure operating at W-band for imaging applications. This antenna system, reduces the needed time for image acquisition maintaining as much lower cost as possible by substituting the mechanical sweep in one of the axis by an electronic frequency sweep. Nice preliminary results have been obtained with the system proposed. The image of an object has also been acquired but further improvements in the system need to be implemented to increase the overall quality of the proposed configuration. Reasonable quality video image acquisition system at W-band using only one detector will be the final goal.

http://www.eucap2013.org/

Anteral in the Innovacción supplement of newspaper Diario de Noticias

Anteral appears in the Innovacción supplement of October 2012 of Spanish newspaper Diario de Noticias as one of the four success cases of companies born under the initiative EIBT of innovative companies with technological base.

 

Anteral will attend the IEEE International Microwave Symposium 2013 Exhibition

 

Anteral will attend the IEEE International Microwave Symposium 2013 Exhibition that will be held from the 4th to the 6th of June 2013 at the Washington State Convention Center, Seattle, USA. The IMS  is the premier annual international microwave meeting, with the biggest commercial exhibition event.

More info: http://www.ims2013.org

 

Anteral invited to the International EIBTs Business Meeting Tech Sines

Anteral has been invited and will attend the Tech Sines event that will be celebrated on November 27th in Sines (Portugal) with the participation of distinguished companies from the Alentejo region that operate in sectors like mining, chemist, agro food, and technological startups of recent creation, coming from the five Sudoe regions working on this project: Asturias, Aquitania, Navarra, Basque Country and Alentejo.

For more information (Portuguese): http://www.sinestecnopolo.org/TechSines

Anteral at the European Microwave Week 2012 Exhibition

The European Microwave Week 2012 exhibition took place from October 29 to 31, and was a great success, as is usual in the premier microwave event in Europe.

Anteral’s presence was also very productive, and the company had the opportunity of showing its product portfolio, as well as some examples of its cutting-edge fabrication technology, in the form of several 500GHz standard gain horn antennas.

The new encapsulated Terahertz sensor TSW-90 in W-band was also presented, attracting a lot of attention from the visitors focused in THz technologies.

 

Anteral's CEO Jose Morales

 

Anteral's R&D Engineers Aitor Martínez and Asier Ibáñez

 

 

Anteral's stand with brochures and product exhibition

 

Anteral also received the visit of a representation of the Spanish Embassy in the Netherlands that came to the event to support the exporting efforts of the Spanish companies in the EuMW 2012.

 

Spanish Embassy commercial delegate visiting Anteral's booth.

 

Anteral presents its new encapsulated Terahertz sensor TSW-90 in W-band

Anteral presents its new encapsulated Terahertz sensor TSW-90 in W-band, with a range of operation from 80 to 100 GHz. This sensor output provides a DC voltage proportional to the power received in the working band.



Image: The front interface of the TSW-90 sensor.

Read more info

Anteral in the prestigious IEEE Microwave Magazine

The "European Microwaves" article by Roberto Sorrentino and Jan Grahn in the prestigious IEEE Microwave Magazine September/October 2012 issue, mentions Anteral as one of the Spanish companies with business presence in the Microwaves field.

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6305017


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